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Institut für Leistungselektronik und Elektrische Antriebe
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Eckstein, M.Sc., Mattea

Mattea Eckstein, M.Sc.

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Akademische Mitarbeiterin
Institut für Leistungselektronik und Elektrische Antriebe

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+49 711 685 67370
+49 711 685 67378
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Pfaffenwaldring 47
70569 Stuttgart
Deutschland
Raum: 1.250, ETI 1

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Publikationen

2023
1. Ziegler, P., Linzmaier, J., Haarer, J., Marx, P., Eckstein, M., Roth-Stielow, J.: Wide Bandwidth Current Sensors and the Influence on the Switching Loss Characterization. In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia). pp. 1181–1188 (2023).
  - BibTeX
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  BibTeX
  @inproceedings{10213817, abstract = {Due to their outstanding properties, wide bandgap semiconductor devices enable better performance and efficiency in power electronic circuits compared to silicon devices. However, characterizing the switching loss of such devices is even more challenging. The limits of measurement equipment, especially for the current measurement, are reached due to the fast rise and fall times. Ideal characterization requires a non-invasive, infinite bandwidth current sensor. This paper presents a galvanically isolated current sensor that combines magnetic field sensors and a printed circuit board integrated Rogowski coil. The insertion inductance of the hybrid current sensor is compared to a commercial coaxial shunt and a low inductance SMD shunt approach. The influence of the different current measurement devices on the switching loss characterization is investigated.}, author = {Ziegler, Philipp and Linzmaier, Jan and Haarer, Jörg and Marx, Philipp and Eckstein, Mattea and Roth-Stielow, Jörg}, booktitle = {2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)}, issn = {2150-6086}, month = {05}, pages = {1181-1188}, title = {Wide Bandwidth Current Sensors and the Influence on the Switching Loss Characterization}, url = {https://ieeexplore.ieee.org/document/10213817}, year = 2023 }
  Link
  https://ieeexplore.ieee.org/document/10213817
2. Ziegler, P., Haarer, J., Marx, P., Eckstein, M., Haspel, A., Roth-Stielow, J.: Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices. In: 2023 25th European Conference on Power Electronics and Applications (EPE’23 ECCE Europe). pp. 1–9 (2023).
  - BibTeX
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  BibTeX
  @inproceedings{10264595, abstract = {Characterizing the switching losses of wide bandgap semiconductor devices requires wide bandwidth measurement equipment with the smallest possible insertion inductance added to the commutation path by the current sensor. A common current measurement approach is using low-cost off-the-shelf SMD resistors and measure the voltage drop. This SMD shunt approach has a limited bandwidth due to parasitic inductances. In this work, an evaluation of such a low-cost current shunt is performed. The influences and constraints that limit the bandwidth are investigated. The design of a compensation network and the resulting bandwidth improvement are examined. Based on the theoretical discussion, a compact current shunt is designed, that allows a simple integration into the commutation path while adding a low insertion inductance. The measurement results show, that the common measurement approach can reach a bandwidth of several hundred MHz if the design constraints are met and can be further extended by a compensation network.}, author = {Ziegler, Philipp and Haarer, Jörg and Marx, Philipp and Eckstein, Mattea and Haspel, André and Roth-Stielow, Jörg}, booktitle = {2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)}, month = {09}, pages = {1-9}, title = {Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices}, url = {https://ieeexplore.ieee.org/document/10264595}, year = 2023 }
  Link
  https://ieeexplore.ieee.org/document/10264595
3. Haspel, A., Ketchedjian, V., Marx, P., Eckstein, M., Roth-Stielow, J.: Composition of the Countervoltage for Power-Hardware-in-the-Loop Emulators for Three-Phase Machines. In: 2023 25th European Conference on Power Electronics and Applications (EPE’23 ECCE Europe). pp. 1–10 (2023).
  - BibTeX
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  BibTeX
  @inproceedings{10264532, abstract = {To emulate the reaction of an electrical machine interacting with a device-under-test inverter, a power-hardware-in-the-loop emulator has to provide a suitable countervoltage per phase. For the correct emulation of the dynamic electrical behavior of the machine, especially the current ripple, the countervoltage has to include a steady oscillating component and a stepwise changing component. This paper introduces a novel approach to determine the analytically ideal shape of the countervoltage for the emulation of three-phase machines and provides a simulative validation. As example, a synchronous machine operated with a two-level voltage source inverter is regarded. It is shown that the relation between the machine’s direct and quadrature inductances as well as the coupling between the device-under-test inverter and the emulator have a significant influence on the shape of the countervoltage.}, author = {Haspel, André and Ketchedjian, Vasken and Marx, Philipp and Eckstein, Mattea and Roth-Stielow, Jörg}, booktitle = {2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)}, month = {09}, pages = {1-10}, title = {Composition of the Countervoltage for Power-Hardware-in-the-Loop Emulators for Three-Phase Machines}, url = {https://ieeexplore.ieee.org/document/10264532}, year = 2023 }
  Link
  https://ieeexplore.ieee.org/document/10264532
2022
1. Haarer, J., Eckstein, M., Ziegler, P., Marx, P., Hirning, D., Roth-Stielow, J.: A Calorimetric and Electrical Method for Measuring Loss Energies of Half-Bridges. In: IEEE (ed.) 2022 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe). pp. 1–9 (2022).
  - BibTeX
  - Link
  BibTeX
  @inproceedings{9907102, abstract = {For the optimal design of power electronic systems the exact knowledge about the different loss mechanisms of the used semiconductor devices is essential. However, conventional measurement methods based on electrical parameters are facing their limits, as switching speed of modern power devices is steadily increasing enabled by the use of wide bandgap semiconductor materials. For this reason, calorimetric measurement techniques are becoming more and more popular. However, due to the nature of their principle, calorimetric measurement methodologies can usually only determine the total power losses of the device under test. To overcome this disadvantage a methology which combines different calorimetric and electrical measurements to separately determine the switching and conduction energies in a half-bridge with an ohmic-inductive load while maintaining the accuracy of calorimetric measurement methods is developed. In addition, the presented methodology identifies the switching energies of the two different switching transitions within one switching period, depending on the load current as well as the dead time, considering thermal influences. A hardware setup for the presented methology, is realized. Using this test setup, the loss energies of a half-bridge based on silicon carbide MOSFETs are investigated. The resulting measurements are presented and verified by measurements with a power analyzer.}, author = {Haarer, Jörg and Eckstein, Mattea and Ziegler, Philipp and Marx, Philipp and Hirning, David and Roth-Stielow, Jörg}, booktitle = {2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)}, editor = {IEEE}, language = {en}, month = {09}, pages = {1-9}, title = {A Calorimetric and Electrical Method for Measuring Loss Energies of Half-Bridges}, url = {https://ieeexplore.ieee.org/document/9907102}, year = 2022 }
  Link
  https://ieeexplore.ieee.org/document/9907102

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https://orcid.org/0000-0002-3768-2151

Mattea Eckstein, M.Sc.

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Mattea Eckstein, M.Sc.

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