Wir laden Sie herzlich zum Online-Workshop "Paving the Way for Seamless Characterization, Simulation and Development" ein.
- 04.März 2021, 09:30 - 13:45 Uhr
Anmeldung:
Der Workshop richtet sich an Anwender und Entwickler von leistungselektronischen Systemen sowie an Hersteller von Leistungshalbleiter- und Simulationswerkzeugen.
Registrieren Sie sich bitte bis zum 01.März 2021 auf der Website der Veranstaltung. Der Workshop ist kostenlos.
Kontakt: Alexandra Fabricius, VDE DKE, +49 69 6308-453, alexandra.fabricius@vde.com
Das in zwei Breakout-Sessions gesammelte Feedback und die Anforderungen der Teilnehmer in die laufenden Arbeiten und die daraus resultierenden Normungsvorschläge für die Internationale Elektrotechnische Kommission IEC ein.
Agenda:
09:30 - 09:40 Begrüßung | Alexandra Fabricius, VDE|DKE
09:40 - 09:50 Vortrag: Converter design: But where do I find the right device model? How a machine-readable datasheet can speed up the design process | Anna-Lena Heller, PE-Systems GmbH
09:50 - 10:00 Vortrag: Double pulse testing of fast switching devices: challenges and opportunities | Uwe Jansen, Infineon Technologies AG
10:00 - 10:20 Vortrag: Challenges in Switching-Loss Determination of Fast-Switching Wide-Bandgap Semiconductors | Ying Su, PTB Physikalisch Technische Bundesanstalt | Dominik Koch, Philipp Ziegler, University of Stuttgart
10:20 - 10:30 Wechsel zu den Breakout-Sessions
10:30 - 12:00
Breakout Sessions
Track 1:Machine-readable Datasheet:
Requirements, Hurdles, Solutions Vendors of power semiconductor devices have to decide for which of the available simulation tools they provide a model. How convenient the setup of a simulation for a customer is depends on whether they use the “right” tool. In the worst case, the device will not be considered due to the lack of a suitable model. By providing a machine-readable datasheet, the process of device model parametrization can be automated by the toolchain manufacturers. During the breakout session, all stakeholders are able to name and discuss their requirements to be taken up by the project in the standardization activities.
Track 2:Double Pulse Test Setups: Capabilities, Targets, Gaps:
Double pulse testing of power semiconductors is a well-established method for power device characterization at the device manufacturer but with the introduction of wide bandgap devices like SiC new challenges arise. On the other hand, many design engineers are not aware what additional benefits double pulse testing in their own setup could provide. In an interactive session we will collect inputs from the participants to evaluate to what extent the MessLeha project already addresses the gaps and where further work is needed.
12:00–13:00 Mittagspause
13:00–13:30 Zusammenfassung und Ergebnisse des Workshops | MessLeha Partner
13:30–13:40 Nächste Schritte
13:40–13:45 Verabschiedung | Alexandra Fabricius, VDE|DKE
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