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Marx, M.Sc., Philipp

Philipp Marx, M.Sc.

Research associate
Institute for Power Electronics and Electrical Drives

Contact

+49 711 685 67373
+49 711 685 67378
Email

Pfaffenwaldring 47
70569 Stuttgart
Germany
Room: 1.253, ETI 1

Office Hours

Only with an appointment

Publications

2023
1. Ziegler, P., Linzmaier, J., Haarer, J., Marx, P., Eckstein, M., Roth-Stielow, J.: Wide Bandwidth Current Sensors and the Influence on the Switching Loss Characterization. In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia). pp. 1181–1188 (2023).
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  @inproceedings{10213817, abstract = {Due to their outstanding properties, wide bandgap semiconductor devices enable better performance and efficiency in power electronic circuits compared to silicon devices. However, characterizing the switching loss of such devices is even more challenging. The limits of measurement equipment, especially for the current measurement, are reached due to the fast rise and fall times. Ideal characterization requires a non-invasive, infinite bandwidth current sensor. This paper presents a galvanically isolated current sensor that combines magnetic field sensors and a printed circuit board integrated Rogowski coil. The insertion inductance of the hybrid current sensor is compared to a commercial coaxial shunt and a low inductance SMD shunt approach. The influence of the different current measurement devices on the switching loss characterization is investigated.}, author = {Ziegler, Philipp and Linzmaier, Jan and Haarer, Jörg and Marx, Philipp and Eckstein, Mattea and Roth-Stielow, Jörg}, booktitle = {2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)}, issn = {2150-6086}, month = {05}, pages = {1181-1188}, title = {Wide Bandwidth Current Sensors and the Influence on the Switching Loss Characterization}, url = {https://ieeexplore.ieee.org/document/10213817}, year = 2023 }
  Link
  https://ieeexplore.ieee.org/document/10213817
2. Ziegler, P., Bura, M., Haarer, J., Marx, P., Hirning, D., Roth-Stielow, J.: Signal Processing Design for Wide Bandwidth Hybrid Current Sensor based on Enhanced Analog Operational Amplifier Circuit. 2023, IEEJ Journal of Industry Applications. Volume 12 Pages, 635–642 (2023).
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  @article{ziegler2023signal, abstract = {Hybrid current sensors are suitable for wide bandwidth current measurement. They entail the fusion of two different measurement circuits, one for DC and low-frequency current and another for high-frequency current. Thus, the advantages of the different measurement principles are incorporated in one current sensor. Hybrid current sensors generate output signals through a superposition of the signals from the low-frequency and high-frequency current sensors. This is realized using analog signal processing by means of an analog operational amplifier circuit. Realization of the superposition of the frequency responses of the different measurement circuits to achieve a constant gain in the transition area is challenging. This study focused on the analog signal processing and its enhancement. Specifically, two possible signal processing approaches to increase the bandwidth based on the state-of-the-art realization of a low-pass filter were devised. These approaches were investigated using a simulation model. Frequency response measurements using a hybrid current sensor based on tunneling magnetoresistance sensors and a Rogowski coil were used for verification. The results show that by enhancing the signal processing, the bandwidth of the current sensors can be significantly increased.}, author = {Ziegler, Philipp and Bura, Michael and Haarer, Jörg and Marx, Philipp and Hirning, David and Roth-Stielow, Jörg}, journal = {2023, IEEJ Journal of Industry Applications}, number = {Issue 4}, pages = {635-642}, title = {Signal Processing Design for Wide Bandwidth Hybrid Current Sensor based on Enhanced Analog Operational Amplifier Circuit}, url = {https://www.jstage.jst.go.jp/article/ieejjia/12/4/12_22007463/_article}, volume = {Volume 12 Pages }, year = 2023 }
  Link
  https://www.jstage.jst.go.jp/article/ieejjia/12/4/12_22007463/_article
3. Ziegler, P., Haarer, J., Marx, P., Eckstein, M., Haspel, A., Roth-Stielow, J.: Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices. In: 2023 25th European Conference on Power Electronics and Applications (EPE’23 ECCE Europe). pp. 1–9 (2023).
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  @inproceedings{10264595, abstract = {Characterizing the switching losses of wide bandgap semiconductor devices requires wide bandwidth measurement equipment with the smallest possible insertion inductance added to the commutation path by the current sensor. A common current measurement approach is using low-cost off-the-shelf SMD resistors and measure the voltage drop. This SMD shunt approach has a limited bandwidth due to parasitic inductances. In this work, an evaluation of such a low-cost current shunt is performed. The influences and constraints that limit the bandwidth are investigated. The design of a compensation network and the resulting bandwidth improvement are examined. Based on the theoretical discussion, a compact current shunt is designed, that allows a simple integration into the commutation path while adding a low insertion inductance. The measurement results show, that the common measurement approach can reach a bandwidth of several hundred MHz if the design constraints are met and can be further extended by a compensation network.}, author = {Ziegler, Philipp and Haarer, Jörg and Marx, Philipp and Eckstein, Mattea and Haspel, André and Roth-Stielow, Jörg}, booktitle = {2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)}, month = {09}, pages = {1-9}, title = {Evaluation of a Low-Cost Wide Bandwidth Current Shunt for Characterization of Wide Bandgap Semiconductor Devices}, url = {https://ieeexplore.ieee.org/document/10264595}, year = 2023 }
  Link
  https://ieeexplore.ieee.org/document/10264595
4. Ziegler, P., Al-Hussainy, A., Haarer, J., Marx, P., Roth-Stielow, J.: Design of a 2 kA Pulsed Current Source for Characterization of Current Sensors. In: PCIM Europe 2023; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. pp. 1–8 (2023).
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  @inproceedings{10173269, abstract = {This paper presents the design of a 2 kA pulsed current source. It uses parallel connected silicon carbid semiconductor devices to provide high current amplitudes and short rise and fall times. Also a custom gate driver, based on a galium nitride half-bridge, is used to allow short turn on and off times of the parallel connected semiconductor devices. In this way, current pulses with amplitudes up to 2 kA and rise and fall times of less than 60 ns can be generated by the current source, which are typical of today’s commutation current in power electronic systems.Therefore, it can be used for the characterization and comparison of highly dynamic current sensors.}, author = {Ziegler, Philipp and Al-Hussainy, Abbas and Haarer, Joerg and Marx, Philipp and Roth-Stielow, Joerg}, booktitle = {PCIM Europe 2023; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management}, month = {05}, pages = {1-8}, title = {Design of a 2 kA Pulsed Current Source for Characterization of Current Sensors}, url = {https://ieeexplore.ieee.org/document/10173269}, year = 2023 }
  Link
  https://ieeexplore.ieee.org/document/10173269
5. Haspel, A., Ketchedjian, V., Marx, P., Eckstein, M., Roth-Stielow, J.: Composition of the Countervoltage for Power-Hardware-in-the-Loop Emulators for Three-Phase Machines. In: 2023 25th European Conference on Power Electronics and Applications (EPE’23 ECCE Europe). pp. 1–10 (2023).
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  @inproceedings{10264532, abstract = {To emulate the reaction of an electrical machine interacting with a device-under-test inverter, a power-hardware-in-the-loop emulator has to provide a suitable countervoltage per phase. For the correct emulation of the dynamic electrical behavior of the machine, especially the current ripple, the countervoltage has to include a steady oscillating component and a stepwise changing component. This paper introduces a novel approach to determine the analytically ideal shape of the countervoltage for the emulation of three-phase machines and provides a simulative validation. As example, a synchronous machine operated with a two-level voltage source inverter is regarded. It is shown that the relation between the machine’s direct and quadrature inductances as well as the coupling between the device-under-test inverter and the emulator have a significant influence on the shape of the countervoltage.}, author = {Haspel, André and Ketchedjian, Vasken and Marx, Philipp and Eckstein, Mattea and Roth-Stielow, Jörg}, booktitle = {2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)}, month = {09}, pages = {1-10}, title = {Composition of the Countervoltage for Power-Hardware-in-the-Loop Emulators for Three-Phase Machines}, url = {https://ieeexplore.ieee.org/document/10264532}, year = 2023 }
  Link
  https://ieeexplore.ieee.org/document/10264532
2022
1. Marx, P., Assenheimer, J., Ziegler, P., Haarer, J., Roth-Stielow, J.: Reduction of Common Mode Disturbances in Parallel Modules of Integrated Modular Motor Drives. In: IEEE (ed.) 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia). pp. 595–600 (2022).
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  @inproceedings{9806860, abstract = {Decreasing switching transition times and miniaturizing power electronic designs lead to higher electromagnetic disturbances. By synchronizing opposed switching transitions, common mode disturbances can be reduced without additional filters. This paper presents an approach to synchronize the switching transitions in parallel modules of integrated modular motor drives. Based on examinations on the parasitic impedances, switching transitions are synchronized in a proper way to ensure best results. Furthermore, the timing of the switching commands is adjusted to compensate differences in the propagation delay. The approach is validated by measurements on a test setup.}, author = {Marx, Philipp and Assenheimer, Jan and Ziegler, Philipp and Haarer, Jörg and Roth-Stielow, Jörg}, booktitle = {2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)}, editor = {IEEE}, isbn = {978-4-8868-6425-3}, month = {05}, pages = {595-600}, title = {Reduction of Common Mode Disturbances in Parallel Modules of Integrated Modular Motor Drives}, url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9806860}, year = 2022 }
  Link
  https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9806860
2. Ziegler, P., Bura, M., Haarer, J., Marx, P., Hirning, D., Roth-Stielow, J.: Optimization Approaches for the Signal Processing of Hybrid Current Sensors. In: IEEE (ed.) 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia). pp. 506–513 (2022).
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  @inproceedings{9807001, abstract = {Hybrid current sensors are suitable devices for wide bandwidth current measurement. They combine two different measurement circuits, one for DC and low-frequency current measurement and another for high frequency current measurement. This combines the advantages of different measurement principles in one current sensor. The output signal of the hybrid current sensor is generated through a superposition of the low-frequency and high-frequency current sensor. This is realized using analog signal processing by means of an analog operational amplifier circuit. The challenge is to superpose the frequency responses of the different measurement circuits achieving a constant gain in the transition area. This paper focuses on the analog signal processing and its optimization. Based on a state-of-the-art realization, two possible optimization approaches of the signal processing are presented to increase the bandwidth. These optimization approaches are investigated in a simulation model and verified by frequency response measurements of a hybrid current sensor based on tunneling magnetoresistance sensors and a Rogowski coil.}, author = {Ziegler, Philipp and Bura, Michael and Haarer, Jörg and Marx, Philipp and Hirning, David and Roth-Stielow, Jörg}, booktitle = {2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)}, editor = {IEEE}, month = {05}, pages = {506-513}, title = {Optimization Approaches for the Signal Processing of Hybrid Current Sensors}, url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9807001}, year = 2022 }
  Link
  https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9807001
3. Marx, P., Seybold, F., Ziegler, P., Hirning, D., Roth-Stielow, J.: Investigations on the Active Reduction of Common Mode Noise with Opposing Noise Sources. In: 2022 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe). pp. 1–9. IEEE (2022).
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  @inproceedings{9907509, abstract = {Conventional filters needed for the electromagnetic compatibility lower the system power density by consuming additional space in power electronic setups. To increase the power density, alternatives for these filters are needed. If the power electronic setup offers the possibility to synchronize two opposing switching transitions, the common mode noise can be reduced without additional filters. In this case two opposing noise currents reduce one another by superimposition. For power electronic setups which do not offer the possibility to synchronize switching transitions, this paper presents an approach which uses additional half bridges as opposing noise sources connected to a replicated grounding impedance to create the opposing common mode noise. The main goal of the opposing noise source is to create similar potential changes as the power electronic setup over the replicated grounding impedance. The replicated grounding impedance emulates the grounding impedance of an ohmic inductive load with discrete elements. The achieved reduction of the common mode noise with this approach is evaluated with measurements.}, author = {Marx, Philipp and Seybold, Felix and Ziegler, Philipp and Hirning, David and Roth-Stielow, Jörg}, booktitle = {2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)}, isbn = {978-9-0758-1539-9}, month = {09}, pages = {1-9}, publisher = {IEEE}, title = {Investigations on the Active Reduction of Common Mode Noise with Opposing Noise Sources}, url = {https://ieeexplore.ieee.org/document/9907509}, year = 2022 }
  Link
  https://ieeexplore.ieee.org/document/9907509
4. Ziegler, P., Festerling, T., Haarer, J., Marx, P., Hirning, D., Roth-Stielow, J.: Influences of Parasitic Capacitances in Wide Bandwidth Rogowski Coils for Commutation Current Measurement. In: IEEE (ed.) 2022 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe). pp. 1–10 (2022).
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  @inproceedings{9907377, abstract = {This paper focuses on the capacitive coupling of PCB integrated Rogowski coils for commutation current measurement. It investigates the cause and the influence of parasitic capacitances on the measurement signal. It discusses the advantages of a differential winding arrangement and the reasons why shielding is not an option in this application. The parasitic capacitance of three different winding arrangements are measured and compared to a Rogowski coil approach with minimized parasitic capacitance. On the base of sensor prototypes, the influence on the measurement is investigated in a pulsed current source.}, author = {Ziegler, Philipp and Festerling, Tobias and Haarer, Jorg and Marx, Philipp and Hirning, David and Roth-Stielow, Jorg}, booktitle = {2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)}, editor = {IEEE}, isbn = {978-9-0758-1539-9}, month = {09}, pages = {1-10}, title = {Influences of Parasitic Capacitances in Wide Bandwidth Rogowski Coils for Commutation Current Measurement}, url = {https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9907377}, year = 2022 }
  Link
  https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9907377
2021
1. Ziegler, P., Stjepandic, F., Ruthardt, J., Marx, P., Fischer, M., Roth-Stielow, J.: Wide Bandwidth Current Sensor for Characterization of High Current Power Semiconductor Modules. In: 2021 23rd European Conference on Power Electronics and Applications (EPE’21 ECCE Europe). pp. 1–9 (2021).
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  @inproceedings{9570438, abstract = {This paper presents a current sensor for commutation current measurement of high current power semiconductor modules with a bandwidth from DC up to 240 MHz. It is integrated in the commutation path with a coaxial housing generating a specified measurement point adding a low insertion inductance of 1.8 nH. It consists of tunnel-magnetoresistance sensors for low frequency current measurement and a PCB integrated Rogowski coil for high frequency current measurement. The measurement techniques are combined using the HOKA principle. The DC current linearity, the dynamic behavior as well as the signal-to-noise ratio of the current sensor is characterized.}, author = {Ziegler, Philipp and Stjepandic, Franjo and Ruthardt, Johannes and Marx, Philipp and Fischer, Manuel and Roth-Stielow, Jörg}, booktitle = {2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)}, month = {09}, pages = {1-9}, title = {Wide Bandwidth Current Sensor for Characterization of High Current Power Semiconductor Modules}, url = {https://ieeexplore.ieee.org/document/9570438}, year = 2021 }
  Link
  https://ieeexplore.ieee.org/document/9570438
2. Ruthardt, J., Klinkhammer, A., Marx, P., Ziegler, P., Nitzsche, M., Sharma, K., Roth-Stielow, J.: Lifetime Extension of Power Semiconductor Devices by Closed-Loop Junction Temperature Control. In: 2021 23rd European Conference on Power Electronics and Applications (EPE’21 ECCE Europe). pp. 1–10 (2021).
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  @inproceedings{ruthardt2021lifetime, abstract = {The lifetime of power semiconductor devices is mainly affected by the thermal stress they are exposed to. Especially temperature swings damage these devices due to different coefficients of thermal expansion of the material layers inside the device. This leads to mechanical strain between these layers. This paper proposes a closed loop junction temperature control system, which is able to reduce occurring temperature swings in order to reduce the damage and to extend the expected lifetime. An online junction temperature measurement is required in order to obtain information about the real-time temperature. This is realized by measuring the temperature sensitive on-resistance of the used MOSFET. Then, the junction temperature is estimated with a calibration curve. Another requirement is the possibility to influence the junction temperature during operation. Therefore, the switching frequency is varied to affect the switching losses. This influences the junction temperature. In addition, a set-value generator is presented, which generates suitable set values to reduce temperature swings.}, author = {Ruthardt, Johannes and Klinkhammer, Arvid and Marx, Philipp and Ziegler, Philipp and Nitzsche, Maximilian and Sharma, Kanuj and Roth-Stielow, Jörg}, booktitle = {2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)}, isbn = {978-9-0758-1537-5}, month = {09}, pages = {1-10}, title = {Lifetime Extension of Power Semiconductor Devices by Closed-Loop Junction Temperature Control}, url = {https://ieeexplore.ieee.org/document/9570681}, year = 2021 }
  Link
  https://ieeexplore.ieee.org/document/9570681
3. Marx, P., Assenheimer, J., Ruthardt, J., Ziegler, P., Nitzsche, M., Fischer, M., Roth-Stielow, J.: Common Mode Voltage Cancellation in Integrated Modular Motor Drives. In: 2021 23rd European Conference on Power Electronics and Applications (EPE’21 ECCE Europe). p. P.1-P.9 (2021).
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  @inproceedings{9570411, abstract = {Increasing switching transition slopes and miniaturizing of power electronic set-ups lead to more problems due to electromagnetic interference (EMI). This paper presents a concept to suppress the electromagnetic disturbances in modular electrical drives without using common mode filters. The usage of full bridge converters enables the synchronization of the switching transitions to suppress the emitted common mode disturbances of every single module. To evaluate the concept, the parasitic paths of a single module are investigated. With consideration of the parasitic paths, an accurate EMI model is built which identifies improvements for the cancellation concept in future applications. Finally, the concept and the simulation model are verified by measurements.}, author = {Marx, Philipp and Assenheimer, Jan and Ruthardt, Johannes and Ziegler, Philipp and Nitzsche, Maximilian and Fischer, Manuel and Roth-Stielow, Jörg}, booktitle = {2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)}, month = {09}, pages = {P.1-P.9}, title = {Common Mode Voltage Cancellation in Integrated Modular Motor Drives}, url = {https://ieeexplore.ieee.org/document/9570411}, year = 2021 }
  Link
  https://ieeexplore.ieee.org/document/9570411
2020
1. Ruthardt, J., Schnabel, L., Ziegler, P., Marx, P., Sharma, K., Fischer, M., Nitzsche, M., Roth-Stielow, J.: Closed Loop Junction Temperature Control of Power Transistors for Lifetime Extension. In: 2020 IEEE Applied Power Electronics Conference and Exposition (APEC). pp. 2955–2955. , New Orleans, USA, (2020).
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  @inproceedings{9124000, abstract = {The lifetime of power transistors significantly depends on the junction temperature swings. These temperature swings occur, for instance when the load conditions of the power electronic circuit change. In this work, a closed loop junction temperature control system is designed to increase the expected lifetime of power transistors. Therefore, the control system reduces the occurring temperature swings by influencing the power losses of the power transistor. For that, the gate driver’s supply voltage is adjusted, which affects the switching speed and the conduction characteristics. The junction temperature is measured by determination of the temperature sensitive internal gate resistance via the high-frequency gate-signalinjection method and fed back to the junction temperature controller. Both, the junction temperature measurement method and the control system are evaluated with a three-phase two-level voltage-source inverter. It is extended by a control strategy, which calculates a suitable set value for the controller in order to reduce junction temperature swings.}, address = {New Orleans, USA,}, author = {Ruthardt, Johannes and Schnabel, Lukas and Ziegler, Philipp and Marx, Philipp and Sharma, Kanuj and Fischer, Manuel and Nitzsche, Maximilian and Roth-Stielow, Jörg}, booktitle = {2020 IEEE Applied Power Electronics Conference and Exposition (APEC)}, eventdate = {15-19. March 2020}, issn = {2470-6647}, month = {03}, pages = {2955-2955}, title = {Closed Loop Junction Temperature Control of Power Transistors for Lifetime Extension}, url = {https://ieeexplore.ieee.org/document/9124000/}, year = 2020 }
  Link
  https://ieeexplore.ieee.org/document/9124000/
2019
1. Zehelein, M., Portik, J., Nitzsche, M., Marx, P., Roth-Stielow, J.: Reduction of the Leakage Currents by Switching Transition Synchronization for a Four-Switch Buck-Boost Converter. In: 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia). pp. 2217–2223. IEEE (2019).
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  @inproceedings{8796950, abstract = {Wide-bandgap transistors are operated at much higher switching transition voltage slopes and current slopes compared to silicon power transistors. For the design of new power electronic devices compactness is a main focus, which increases parasitic capacitances of the device. This trend leads to significantly higher common and differential mode distortions especially at high frequency ranges. To overcome this drawback, efficient filter techniques for these distortions are necessary. This paper focuses on the leakage current reduction in four switch buck-boost converter topologies by synchronizing the switching transitions of the buck and boost stage to achieve a leakage current cancellation. By designing two similar leakage current paths and using destructive interference of two inversely excited leakage currents, the overall leakage current at the heat sink of the device is decreased. This study investigates the effectiveness of the leakage current reduction depending on different operating points for buck and boost operation.}, author = {Zehelein, Matthias and Portik, Julian and Nitzsche, Maximilian and Marx, Philipp and Roth-Stielow, Jörg}, booktitle = {2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia)}, eventdate = {27-30 May 2019}, month = {05}, organization = {IEEE}, pages = {2217-2223}, title = {Reduction of the Leakage Currents by Switching Transition Synchronization for a Four-Switch Buck-Boost Converter}, year = 2019 }
2. Ruthardt, J., Muñoz Barón, K., Marx, P., Sharma, K., Nitzsche, M., Fischer, M., Roth-Stielow, J.: Online Junction Temperature Measurement via Internal Gate Resistance Using the High Frequency Gate Signal Injection Method. In: PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. pp. 1–7. VDE Verlag (2019).
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  @inproceedings{8767601, abstract = {In many power electronic applications, it is important to monitor the junction temperature of the power semiconductor devices. This enables for example an abnormal temperature protection, lifetime monitoring or junction temperature control. This paper proposes an online junction temperature measurement based on the internal gate resistance as a temperature sensitive electrical parameter. A direct measurement of this resistance is not possible. Therefore, a high frequency signal is injected into the gate circuit to measure the gate circuit's impedance, which includes the temperature sensitive internal gate resistance. This paper focuses on a simple realization of this method.}, author = {Ruthardt, Johannes and Muñoz Barón, Kevin and Marx, Philipp and Sharma, Kanuj and Nitzsche, Maximilian and Fischer, Manuel and Roth-Stielow, Jörg}, booktitle = {PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management}, eventdate = {7. - 9. Mai 2019}, isbn = {978-3-8007-4938-6}, language = {English}, month = {05}, pages = {1-7}, publisher = {VDE Verlag}, title = {Online Junction Temperature Measurement via Internal Gate Resistance Using the High Frequency Gate Signal Injection Method}, year = 2019 }

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Philipp Marx, M.Sc.

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