Contact
+49 711 685 67371
+49 711 685 67378
Email
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Pfaffenwaldring 47
70569 Stuttgart
Deutschland
Room: 1.251, ETI 1
Office Hours
Only with an appointment
2023
- Ziegler, P., Bura, M., Haarer, J., Marx, P., Hirning, D., Roth-Stielow, J.: Signal Processing Design for Wide Bandwidth Hybrid Current Sensor based on Enhanced Analog Operational Amplifier Circuit. 2023, IEEJ Journal of Industry Applications. Volume 12 Pages, 635–642 (2023).
2022
- Ziegler, P., Bura, M., Haarer, J., Marx, P., Hirning, D., Roth-Stielow, J.: Optimization Approaches for the Signal Processing of Hybrid Current Sensors. In: IEEE (ed.) 2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia). pp. 506–513 (2022).
- Hirning, D., Bauer, L., Ruthardt, J., Haarer, J., Ziegler, P., Roth-Stielow, J.: Online Junction Temperature Measurement of SiC-MOSFETs via Gate Impedance Using the Gate-Signal Injection Method. In: IEEE (ed.) 2022 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe). pp. 1–9 (2022).
- Marx, P., Seybold, F., Ziegler, P., Hirning, D., Roth-Stielow, J.: Investigations on the Active Reduction of Common Mode Noise with Opposing Noise Sources. In: 2022 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe). pp. 1–9. IEEE (2022).
- Ziegler, P., Festerling, T., Haarer, J., Marx, P., Hirning, D., Roth-Stielow, J.: Influences of Parasitic Capacitances in Wide Bandwidth Rogowski Coils for Commutation Current Measurement. In: IEEE (ed.) 2022 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe). pp. 1–10 (2022).
- Haarer, J., Eckstein, M., Ziegler, P., Marx, P., Hirning, D., Roth-Stielow, J.: A Calorimetric and Electrical Method for Measuring Loss Energies of Half-Bridges. In: IEEE (ed.) 2022 24th European Conference on Power Electronics and Applications (EPE’22 ECCE Europe). pp. 1–9 (2022).
2021
- Ruthardt, J., Hirning, D., Sharma, K., Nitzsche, M., Ziegler, P., Fischer, M., Roth-Stielow, J.: Investigations on Online Junction Temperature Measurement for SiC-MOSFETs Using the Gate-Signal Injection Method. In: 2021 IEEE Energy Conversion Congress and Exposition (ECCE). pp. 5354–5359 (2021). https://doi.org/10.1109/ECCE47101.2021.9595166.